Efficiency of ADC Linearity Estimators

Carbone, Paolo and Nunzi, Emilia and Petri, Dario (2004) Efficiency of ADC Linearity Estimators. Technical Report DIT-04-043, Ingegneria e Scienza dell'Informazione, University of Trento.

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Abstract

The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter. Accordingly, at first a closed–form determination of the Cram´er–Rao bound is derived under the assumption of a noiseless stimulus signal. Both unbiased and biased versions of the bound are described in order to account for the eventual bias introduced by commonly employed estimators. Then, additive Gaussian noise is assumed and comments are made about its effects on the maximum achievable accuracy.

Keywords:	Cram´er–Rao bound, sinewave histogram test, statistical efficiency
Subjects:	T Technology: TK Electrical engineering. Electronics Nuclear engineering: TK7885 Computer Engineering T Technology: TK Electrical engineering. Electronics Nuclear engineering: TK5105.5 Computer Networks T Technology: TK Electrical engineering. Electronics Nuclear engineering
ID Code:	600
Deposited By:	Kerhet, Aliaksei
Deposited On:	02 August 2004

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