Carbone, Paolo and Nunzi, Emilia and Petri, Dario (2004) Efficiency of ADC Linearity Estimators. UNSPECIFIED. (Unpublished)
| PDF Download (297Kb) | Preview |
Abstract
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter. Accordingly, at first a closed–form determination of the Cram´er–Rao bound is derived under the assumption of a noiseless stimulus signal. Both unbiased and biased versions of the bound are described in order to account for the eventual bias introduced by commonly employed estimators. Then, additive Gaussian noise is assumed and comments are made about its effects on the maximum achievable accuracy.
Item Type: | Departmental Technical Report |
---|---|
Department or Research center: | Information Engineering and Computer Science |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7885 Computer Engineering T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK5105.5 Computer Networks T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Uncontrolled Keywords: | Cram´er–Rao bound, sinewave histogram test, statistical efficiency |
Report Number: | DIT-04-043 |
Repository staff approval on: | 02 Aug 2004 |
Actions (login required)
View Item |